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英語 高校生

この教科書のレベルはどのくらいですか教えください この教科書でどのくらいのレベルの大学まで対応できますか?

1 On 10 February 2009, at a height of about 800 kilometers above Siberia, an American satellite collided the first such height [háit] satellite [séetalait] collide(d) [kaláid(id)] with an old Russian satellite. It was collision [kaligan] collision in the history of space development. As a result, fragment(s) [fráegmant(s)) debris [dabri:] more than 1,000 fragments of debris were scattered into space. 2 The image above shows the vast amount of space debris in orbit around Earth. Approximately 22,000 vast [váest] orbit [5:rbat] approximately [aprá:ksamatli) objects larger than 10 centimeters across are floating around Earth. Of these, about 16,000 are from known 10 considering [kansidarig) artificial [a:rtafijal] currently [ks:rantli] operation [a:paréifon] Considering that there are only about 1,000 artificial satellites currently in operation, the amount of Sources. space debris is astonishing. This space debris is not only due to the collision of satellites. For example, when rockets reach space, they s 15 leave behind surplus engines and fuel tanks. These objects remain in orbit as space debris. In addition, surplus s5:rplas] there are tools that astronauts have dropped while tool(s) [t:l(z)) astronaut(s) [astrand:t(s) aluminum [ala:manom per|par] working outside. Even a one-centimeter aluminum ball. when orbiting at a speed of around 10 kilometers per 0 bullet [bálat] second, is far more powerful than a bullet from a gun. gun [gán]

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化学 高校生

RHEED法の原理と得られる7つの情報が、この英文に書かれているみたいなのですが、よく分かりません。 分かる方助けてください!🙇‍♂️

INTRODUCTION Reection high-energy electron diHiraction (RHEED) uses a Rnely collimated electron beam with energy of 10-100 keV. The beam irradiates a sample surface with gazing incidence to obtain forward scattered difraction patterms. RHEED enables us to analyze structures of crystal surfaces at atomic levels and also to in situ monitor growth processes of thin films (mo、1988: Ichimiya and Cohen、2004: Peng et al.. 2011). From the arrangement。intensity and profile of the dilraction spots in RHEED patterns as described below in detail、 one can obtain various kinds of information: (1) the periodicity (unit cells) in atomic arrangements. (2) flat- ness of surfaces. (3) sizes of grains/domains of surface structures and microcrystals grown on the surface. (3) epitaxial relation between the grown flms/islands with respect to the substrate. (5) parameters character- izing structural phase transitions. (6) individual atomic positions in the unit cells. and (7) growth styles of thin films and numbers of atomic layers grown. The most important advantages of the method are that it is quite easy to install the RHEED apparatus in Yarious types of vacuum chambers without interfering with other components of apparatuses and to do real- time monitoring during thin-Rlm growths. Because of these advantages.RHEED is nowwidelyusednotonlyin research Iabs of surfaces and thin fims. but also in device production processes in industry Low-energy electron diiraction (LEED、see article Low-ENNERcy ErecroN DirscmoN)。 in which an electron beam of 10-100 eV in energy is irradiated onto a sample surface with nearly normal incidence to obtain back- scattered difraction patterns. is also widely used to analyze the atomic structures of crystal surfaces. Since one has to make the sample face directly to the LEED

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